Measurement-diverse speckle imaging
US5384455A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 12, 1993 |
| Grant date | Jan 24, 1995 |
| Priority date | — |
| Expiry date | Apr 12, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for obtaining fine resolution imaging of extended objects in the presence of unknown time-varying aberrations, wherein the method is accomplished by obtaining data corresponding to multiple, measurement-diverse images of the extended object collected for each of a plurality of aberration realizations. The object and unknown aberrations are then Jointly estimated, preferably using constrained likelihood-based estimation techniques. The apparatus utilizes a conventional optical system, at least two detector arrays for detecting a plurality of phase-diverse images, a shutter system so that a specklegram can be captured at each of the phase-diverse arrays for each of a plurality of aberration realizations, and a computer including a processor, sufficient memory restoring the digital data corresponding to the captured images, and logic for estimating the object and unknown aberrations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.