Patent · US Expired

Method and device for in-phase measuring of ions from ion trap mass spectrometers

US5386113A · kind A · utility

11Cited by

7References

34Claims

0Family size

Assignee

Bruker-Franzen Analytik GmbH · DE

Inventors

Jochen Franzen · Bremen, DE
Gerhard Heinen · Tarmstedt, DE
Gerhard Weiss · Ludwigshafen, DE
Reemt-Holger Gabling · Stuhr, DE

Key dates

Filing date	Dec 23, 1992
Grant date	Jan 31, 1995
Priority date	—
Expiry date	Dec 23, 2012

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/429
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

The measuring process for generating mass spectra using a sequentially-scanned quadrupole ion trap mass spectrometer, is improved by controlling the measurement of the ion packages ejected from the ion trap so that measurement takes place starting at the anticipated exit times of the ion packages and measurement continues only as far as possible for a time duration corresponding to the length of the ion packages. Measuring only during ion package ejection enables a measurement for the total number of ejected ions having a selected mass to be obtained by means of digital addition of the individual package measurements. Subsequent processing of the data can be carried out with practically only the fluctuations of normal ion counting statistics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.