IC measuring method
US5386189A · kind A · utility
20Cited by
14References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 22, 1992 |
| Grant date | Jan 31, 1995 |
| Priority date | — |
| Expiry date | Jul 22, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An IC measuring method including positioning a plurality of ICS, each having a plurality of circuit blocks performing different functions, selecting different circuit blocks in each of the plurality of ICs, measuring the test results from each of the selected circuit blocks, and selecting a different circuit block in each of the plurality of ICs for the next measurement. The circuit block selection is controlled by a matrix circuit or by physically shifting the positions of the ICs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.