Patent · US Expired

Method of making a semiconductor memory circuit device

US5389558A · kind A · utility

27Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 10, 1993
Grant dateFeb 14, 1995
Priority date
Expiry dateAug 10, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/31

Abstract

In a semiconductor memory circuit device wherein each memory cell is constituted by a series circuit of a memory cell selecting MISFET and an information storing capacitor of a stacked structure, there are present in a first region as a memory cell array region a first MISFET having a gate electrode and source and drain regions; first and second capacity electrodes and a dielectric film extending onto a first insulating film on the gate electrode; a second insulating film positioned on the second capacity electrode; and a first wiring positioned on the second insulating film, while in a second region as a peripheral circuit region there are present a second MISFET having a gate electrode and source and drain regions; a first insulating film on the gate electrode; a third insulating film on the first insulating film; a second insulating film on the third insulating film; and a second wiring on the second insulating film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.