Patent · US Expired

Tamperproof arrangement for an integrated circuit device

US5389738A · kind A · utility

173Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 4, 1992
Grant dateFeb 14, 1995
Priority date
Expiry dateMay 4, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A tamperproof arrangement for an integrated circuit device. The arrangement includes a package and lid fabricated of heavy metals to prevent X-radiation or infrared detection of circuit operation. Sensors and control circuitry are located on the integrated circuit die itself which detect increased temperature and radiation and clear or zeroize any sensitive information included within the integrated circuit device. Electrode finger grids above and below the integrated circuit die detect physical attempts to penetrate the integrated circuit die. Critical circuit functions are segregated from non-critical functions. Power applied to the integrated circuit device is monitored and separated for critical and non-critical circuit functions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.