Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part
US5389876A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 1991 |
| Grant date | Feb 14, 1995 |
| Priority date | — |
| Expiry date | May 6, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current probe array is disclosed comprising a plurality of spatially correlated eddy current probe elements sufficiently disposed within a flexible interconnecting structure to collect a discrete plurality of spatially correlated eddy current measurements for nondestructive near surface flaw detection. A plurality of precisely fabricated, substantially identical elements being sufficiently distributed can accommodate inspecting an area of conductor covered by the active width of the array in a single uni-directional scan. The array structure can flexibly conform to accommodate inspection of large, irregular, curved conductive surfaces which cannot be inspected by conventional means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.