Laser gyro built in test method and apparatus
US5390019A · kind A · utility
8Cited by
4References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 17, 1992 |
| Grant date | Feb 14, 1995 |
| Priority date | — |
| Expiry date | Jul 17, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C19/661
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser gyro built in test apparatus. A laser gyro includes a microprocessor which provides a high speed method of communicating test data to an external inertial navigation system. The microprocessor performs tests on the gyro including temperature sensor tests, dither drive tests, active current control tests, and reports on the expected life of the gyro. The gyro can be commanded from the external system to perform any number of the built in test functions. The built in test functions are periodically executed to evaluate the health of the laser gyro and are thereby incorporated in the monitor control loop of the laser gyro.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.