Analogue probe
US5390424A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 1993 |
| Grant date | Feb 21, 1995 |
| Priority date | — |
| Expiry date | Mar 19, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analogue probe has a fixed structure and a stylus supporting member connected to the fixed structure by three serially mounted pairs of leaf springs interconnected by first and second intermediate members. The stylus supporting member supports an elongate stem upon which a cube, which supports three scales, is mounted. Readheads are mounted on the fixed structure, in register with the scales, to transduce movement of the stylus supporting member in three substantially orthogonal directions. The alignment of the scales about the yaw axis (extending in a direction perpendicular to the plane of the scale) determines the alignment of the measuring axes of the probe, while the straightness of the lines of the scales determines the straightness of the axes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.