Patent · US Expired

Single-side growth reflection-based waveguide-integrated photodetector

US5391869A · kind A · utility

46Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 1993
Grant dateFeb 21, 1995
Priority date
Expiry dateMar 29, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F30/2275
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A single-side growth reflection-based photodetector includes a waveguide structure 8 comprising a "strip-loaded rib" waveguide 10 which accepts light 11 from an input end-face 7 and confines the light to a predetermined spatial optical mode 12. The light 11 propagates along the waveguide 10 and is internally reflected off an edge 18 of a retrograde angled region 20, at one end of the waveguide, to a detector layer 16 where the light 11 is absorbed, thereby creating electron-hole pairs in the detector layer 16. The absorbed light is detected by a metal-semiconductor-metal (MSM) detector comprising an interdigital electrode structure 14 disposed on the outer surface of the detector layer 16 which is disposed above a wide non-waveguide mesa layer 9. For 0.84 micron wavelength light, the detector layer 16 is made of GaAs. Alternatively, for 1.3-1.55 micron light, the detector layer 16 is made of InGaAs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.