Patent · US Expired

Method and apparatus for generating tests for structures expressed as extended finite state machines

US5394347A · kind A · utility

83Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 1993
Grant dateFeb 28, 1995
Priority date
Expiry dateJul 29, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3323
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for generating test programs for an implementation of a specification that has been modeled as an extended finite state machine (EFSM), the EFSM including vertices and transitions, where the transitions represent functions to be performed by the implementation, including predicates and actions such as variable assignments. The method includes traversing the EFSM in a depth-first manner from a root model start state to a root model exit state, through intermediate vertices which may be normal states or models. Models include further vertices and transitions, and may be called as submodels or as go-to models, where a go-to model includes an EFSM exit state. The EFSM may be traversed exhaustively, such that all possible paths are traversed, or in a partial transition coverage mode, where a user-defined subset of the possible paths are traversed. Each traversed path is stored in a path file and converted into a test program in a predetermined language, such as C, for interfacing with the implementation to be tested and testing its functions as represented by the transitions taken. Traversal of the EFSM is made possible by the use of a model stack, a path stack and a variables …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.