Patent · US Expired

Displacement element, cantilever probe and information processing apparatus using cantilever probe

US5396066A · kind A · utility

30Cited by
11References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 1994
Grant dateMar 7, 1995
Priority date
Expiry dateJun 3, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/873
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A displacement element including a substrate having electrodes and a cantilever provided on the substrate, wherein the cantilever is formed from a semiconductor material and has at least two electrostatic driving electrodes formed by diffusing an impurity into a semiconductor material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.