Waveguide type displacement interferometer having two reference paths
US5396328A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 21, 1992 |
| Grant date | Mar 7, 1995 |
| Priority date | — |
| Expiry date | Sep 21, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The interferometer comprises a light source, at least one beam splitting means, a beam combiner means, measuring and reference arms as well as wave guides for guiding the light to the beam splitting means and for guiding the light back to photodetectors. Beam splitting means and beam combiner means are formed by integrated optics elements on a substrate. The wave guides on the substrate form a measuring arm (7.sub.1) and two reference arms (6.sub.1, 8.sub.1) which have different optical path lengths for setting a phase difference. An evaluation electronics for determining correct as to signs, the change in optical path length in the measuring arm (7.sub.1) is connected to the photodetectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.