X-ray diagnostics installation having means for forming a transparency signal

US5396532A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Horst Aichinger · Ergolding, DE
• Karlheinz Koehler · Herzogenaurach, DE

Key dates

• Filing date: Oct 15, 1993
• Grant date: Mar 7, 1995
• Expiry date: Oct 15, 2013

Classification

• Technology area (CPC H): Electricity
• CPC primary: H05G1/44
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

In an x-ray diagnostics installation for mammography, an automatic setting of the optimum beam quality ensues in combination with transparency matching. A set of exposure parameters corresponding to different thicknesses of the examination subject is stored in a memory (reference values). At the beginning of an x-ray exposure, a comparator compares the transparency signal (actual value) to the exposure parameters (reference value) interrogated from the memory dependent on the current thickness of the examination subject, and influences the x-ray tube voltage for the purpose of a rated/actual value comparison without interrupting the exposure.