X-ray based extensometry device
US5398273A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 1993 |
| Grant date | Mar 14, 1995 |
| Priority date | — |
| Expiry date | Apr 30, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A displacement measuring system includes means for focusing x-rays into a narrow, intense beam which can be used to excite targets that fluoresce secondary x-rays. By precisely measuring the focused image position as the focused image is caused to overlap the fluorescing target, relevant changes in target position can be determined. The x-rays are focused using a novel Johansson ground and bent crystal which, along with the x-ray tube, is mounted on a common base for lineal scanning. This common base preferably comprises a linear translation table. By scanning the beam onto fluorescing targets, edge detection can be accomplished by monitoring subsequent x-ray fluorescing using an appropriate detector whose output is measured and recorded. In a preferred embodiment, the detector is formed integral with an enclosure for enclosing the x-ray tube and bent crystal on the linear translation table. By comparing beam position with detector output, an exact measurement of target edge position with respect to that of the crystal can be achieved. If the target is then translated and the scan repeated, a precise measurement of its displacement can be made. If two targets are used with one or m…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.