Device and method for continuously and non-destructively monitoring variation in the thickness of shaped sections
US5399016A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 28, 1993 |
| Grant date | Mar 21, 1995 |
| Priority date | — |
| Expiry date | Jul 28, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for non-destructively and continuously measuring and monitoring the thickness of a shaped section includes an extruder for extruding a thermoplastic material to form a shaped section having a temperature variation extending along a length of said section, at least one unit for measuring and detecting radiation emitted by the section during movement of the shaped section from the extruder and at least one unit for causing the radiation detecting and measuring unit to scan the entire outer surface of the shaped section. The detecting and measuring unit being connected to a computer system including imaging processing software, a radiation recording unit and a display screen for determining a variation in the thickness of the shaped section based on a variation of emitted radiation detected by the detecting and measuring unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.