Apparatus and method for specifying the flow of test execution and the binning for a testing system
US5400263A · kind A · utility
32Cited by
3References
52Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 1992 |
| Grant date | Mar 21, 1995 |
| Priority date | — |
| Expiry date | Apr 6, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a method for specifying test flow and binning of an integrated circuit part in an integrated circuit tester. The method comprises the steps of receiving descriptions of the tests, receiving test flow statements indicating when the tests are to be executed, receiving binning statements, executing the tests as indicated by the test flow statements, and binning the IC device as indicated by the results of the tests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.