Method and apparatus for gloss measurement with reference value pairs
US5401977A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 11, 1991 |
| Grant date | Mar 28, 1995 |
| Priority date | — |
| Expiry date | Jun 11, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12753
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring the gloss of a surface with a light source projecting light in the direction of the surface and a light-sensitive sensor receiving the light reflected from the surface and converting it into an electrical signal value. A memory storing a program for calculating the characteristic gloss value, a computer for calculating a characteristic gloss value from the electrical signal value, and a display for visually displaying the calculated characteristic gloss value are provided. Five or more reference value pairs are stored in the memory, each pair consisting of a reference characteristic gloss value and a corresponding reference electrical signal value measured by the apparatus on the basis of the reference surface. The measured electrical signal value is compared with the reference signal values and at least the next higher and the next lower value for interpolating the measured gloss.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.