Three-dimensional microtomographic analysis system
US5402460A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 2, 1993 |
| Grant date | Mar 28, 1995 |
| Priority date | — |
| Expiry date | Aug 2, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S378/901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microtomographic system (10) for generating high-resolution, three dimensional images of a specimen (16) is disclosed. The microtomograph system includes an x-ray generator (12) that produces an x-ray beam (14), a specimen holder (18) that holds the specimen in the beam, and an x-ray detector (20) that measures the attenuation of the beam through the specimen. Two projections of each view of the specimen are made with this microtomographic system. Each projection is made with a different intensity x-ray beam. After the projections of one view of the specimen are made, the specimen is rotated on the specimen holder and another set of projections are made. The projections of each view of the specimen are analyzed together to provide a quantitative indication of the phase fraction of the material comprising the specimen. The projections of the different views are combined to provide a three-dimensional image of the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.