Method for recognition of abnormal conditions using neural networks
US5402521A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 19, 1992 |
| Grant date | Mar 28, 1995 |
| Priority date | — |
| Expiry date | May 19, 2012 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S706/914
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to the present invention, a method for recognition of normal and abnormal conditions can be performed with at least one neural network. First, trend data of an object system, before a recognition-step, are entered as input data to an input layer of each neural network and data of this system at the recognition-step are entered as objective output data to an output layer of the neural network. Thus, multiple sets of trend data showing at least one normal condition of this system are formed in the neural network in order to obtained learned weights and biases. Next, output data at every recognition-step are predicted by entering actual trend data as input data to the neural network, while the learned weights and biases are utilized. Then, the predicted output data are compared with actual output data at every recognition-step. Finally, the normal and abnormal conditions of this system can be recognized by real time interpretation of deviations between the predicted output data and the actual output data. The method of the present invention particularly can be applied to a control system requiring the recognition of abnormal conditions such as a control system for the operat…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.