Patent · US Expired

Method of making a storage electrode of DRAM cell

US5405799A · kind A · utility

17Cited by
5References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 20, 1993
Grant dateApr 11, 1995
Priority date
Expiry dateOct 20, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/318
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A storage electrode of a DRAM cell in a highly-integrated semiconductor device has, in order to secure the surface area thereof greater than that of a conventional tunnel-type storage electrode, an upper plate of storage electrode formed over a lower plate of storage electrode separated therefrom by a predetermined distance, while interposing bars of various shapes formed of a conductive layer to electrically connect the upper and lower plates, and a method for manufacturing the storage electrode is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.