Specimen-holding device for electron microscope
US5406087A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Jan 18, 1994 |
| Grant date | Apr 11, 1995 |
| Priority date | — |
| Expiry date | Jan 18, 2014 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
There is disclosed a simple specimen-holding device for use with an electron microscope. The device comprises a pair of films which transmit the electron beam. The films are reinforced with a network of reinforcing members and placed on a specimen stage. A specimen to be investigated is held in a thin space formed between the films, together with moisture. The fringes of the films are compressed together to hermetically isolate the space between the films from the specimen chamber of the microscope which is evacuated. The electron beam passes through the thin space sandwiched between the films. This permits the specimen to be observed in an almost unmodified state with little damage to the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.