Apparatus for measuring birefringence and retardation
US5406371A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 1992 |
| Grant date | Apr 11, 1995 |
| Priority date | — |
| Expiry date | Jul 27, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J4/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In order to efficiently obtain data for calculating retardation values at a plurality of wavelengths, a sample having birefringence is placed between a polarizer and an analyzer, which are maintained in a parallel nicol relation to each other and rotated about an optical axis of measuring light. White measuring light is applied through the polarizer so that the light being passed through the sample and transmitted through the analyzer is received by a polychromator. A one-dimensional optical sensor is arranged on an outgoing imaging surface of the polychromator, to simultaneously detect transmitted light intensity values of a plurality of wavelengths. Since transmitted light intensity values of a plurality of wavelengths are obtained every polarization rotation angle of the polarizer and the analyzer, it is possible to obtain dispersion of retardation values with respect to wavelengths and the like by processing the data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.