Patent · US Expired

Tamperproof arrangement for an integrated circuit device

US5406630A · kind A · utility

226Cited by
3References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 10, 1994
Grant dateApr 11, 1995
Priority date
Expiry dateJan 10, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A tamperproof arrangement for an integrated circuit device. The arrangement includes a package and lid fabricated of heavy metals to prevent X-radiation or infrared detection of circuit operation. Sensors and control circuitry are located on the integrated circuit die itself which detect increased temperature and radiation and clear or zeroize any sensitive information included within the integrated circuit device. Electrode finger grids above and below the integrated circuit die detect physical attempts to penetrate the integrated circuit die. Critical circuit functions are segregated from non-critical functions. Power applied to the integrated circuit device is monitored and separated for critical and non-critical circuit functions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.