Gas emission spectrometer and method
US5412467A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 1993 |
| Grant date | May 2, 1995 |
| Priority date | — |
| Expiry date | Mar 24, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/69
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gas emission spectrometer and method for analyzing a continuously flowing gas stream using gas emission spectroscopy to measure low concentration levels of one or more gas/vapor impurities in the gas stream. Alternating power is applied to an electric discharge source to generate emissive radiation which is filtered into an optical signal at the emission wavelength of a preselected impurity gas. The optical signal is converted into an electrical signal which is selectively amplified within a narrow frequency range centered at substantially twice the excitation frequency of the alternating power source. The impurity concentration is measured from the amplified signal upon rectification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.