Electro-optical system for gauging surface profile deviations
US5416589A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 1992 |
| Grant date | May 16, 1995 |
| Priority date | — |
| Expiry date | Oct 13, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for gauging deviations of a surface of a test part from a preselected nominal surface profile is disclosed. One embodiment includes a support having a master surface that is substantially a matched or mating surface of the nominal surface profile of the test part and a thin layer of an attenuating medium such as a dye liquid between the master and test surfaces. In another embodiment, the interface between attenuation fluid and the air is used as a reference surface thereby eliminating the requirement of the master surface. In both embodiments, electromagnetic radiation is directed through the attenuating medium onto the surface of the test part to be gauged. An image sensor such as a camera is positioned to receive an image of the radiation reflected by the test part surface back through the attenuating medium, with the intensity of such radiation across the image varying as a function of the deviation of the test part surface from the nominal surface profile. The sensor output is digitized to form a series of digital signals indicative of the intensity of radiation associated with each location of the reflected image, and the digitized pixel signals are stored…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.