System and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surface
US5418457A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 1993 |
| Grant date | May 23, 1995 |
| Priority date | — |
| Expiry date | Mar 12, 2013 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method is provided for aligning a scanning surface of an inspection probe relative to a workpiece surface under inspection. The probe preferably includes at least three alignment eddy current elements, each producing a respective spacing indication electrical signal in accordance with a spacing between each alignment eddy current element and the workpiece. The system further comprises processing means which receives each spacing-indication electrical signal so as to generate data indicative of the relative alignment between the scanning surface of the probe and the workpiece surface. A controller is responsive to the alignment data for aligning the probe such that in operation the scanning surface thereof is substantially parallel relative to the workpiece surface. The probe can include inspection eddy current elements, in which case the alignment and the inspection eddy current elements can be fabricated to form an integral eddy current inspection probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.