Methods for aligning focusing and normalizing imaging system
US5420945A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 1994 |
| Grant date | May 30, 1995 |
| Priority date | — |
| Expiry date | Sep 15, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/10811
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of the imaging system (10 or 12). The depth gauge (70) is used to align the secondary light beam (26) with the primary light beam (22) so that all documents passing through the track (14) will be evenly illuminated from two points symmetrically offset from a line normal to the track (14). In addition, the depth gauge (70) is used to align a normally reflected beam (32) with a photodetector array (56). Two different trunnion mirrors (54 and 28) are adjusted in the two different alignment operations. The focussing gauge (80) includes a set of black 87 and white 88 stripes positioned on a middle region 86. The white reference gauge (90) has a reflective white coating in its middle region 96. An oscilloscope (100, 210, 300, or 400) is used to display the intensity of reflected light (32) impinging on the photodetector array (56) during all optical alignment and focussing operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.