Patent · US Expired

Circuit and method for testing direct memory access circuitry

US5423029A · kind A · utility

18Cited by
2References
32Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 11, 1993
Grant dateJun 6, 1995
Priority date
Expiry dateMay 11, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2221
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed are an apparatus and method for testing a direct memory access ("DMA") controller. The apparatus comprises (1) a virtual control device including a virtual control latch, the virtual control device coupled to a request input of the DMA controller and capable of transmitting a signal to the DMA controller representing a request to transfer data and (2) a virtual input/output ("I/O") device including a virtual I/O latch, an acknowledgement output of the DMA controller coupled to the virtual I/O device, the virtual I/O latch capable of storing the data for use by the DMA controller. In its preferred embodiment, the present invention operates within the confines of IBM-compatible personal computer architecture, allowing DMA controller functionality to be tested directly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.