Off-axis interface for a mass spectrometer
US5426301A · kind A · utility
24Cited by
3References
4Claims
0Family size
Inventor
Key dates
| Filing date | Jan 21, 1994 |
| Grant date | Jun 20, 1995 |
| Priority date | — |
| Expiry date | Jan 21, 2014 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/061
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass spectometer for analyzing a beam of ions generated from a sample of analyze comprises an analyzer (3) and an interface between the analyze sample (1) and the analyzer. The inlet aperture to the analyzer (13) is positioned off the axis of the ion beam (2) exiting the interface system, and a deflector is (14) provided to generate an electric field between the interface system and the analyzer to deflect the ion beam into the inlet aperture of the analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.