Panel-testing apparatus
US5426862A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 29, 1994 |
| Grant date | Jun 27, 1995 |
| Priority date | — |
| Expiry date | Apr 29, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A panel testing apparatus for measuring the curvature of an inner surface, the thickness of an edge portion, and the thickness of a center portion of the panel comprises a lifting device for accepting and transporting the panel to a testing position, and a panel supporting device for maintaining the panel in a predetermined position during testing. The apparatus comprises a panel inner curvature measuring device, edge thickness measuring device, and a center thickness measuring device, each of which using one or more linear variable differential transformers for the purpose of providing panel measurement data. The apparatus further comprises a studpin leveling device for measuring the burial depth of studpins within the panel and simultaneously leveling the studpins to the same height, and a studpin position measuring device for measuring the horizontal and/or vertical placement of the studpins within the panel, each of which using one or more linear variable differential transformers for the purpose of providing studpin measurement data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.