Combination of X-ray diffractometer and solid state detector and method of use thereof
US5432832A · kind A · utility
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2References
8Claims
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Key dates
| Filing date | Aug 2, 1993 |
| Grant date | Jul 11, 1995 |
| Priority date | — |
| Expiry date | Aug 2, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A combination of X-ray diffractometer and solid state detector is much faster than previous diffractometers and detectors in that X-ray photons that impinge on the detector do not have to be counted in the single photon counting mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.