Patent · US Expired

Method of producing a field effect transistor

US5434094A · kind A · utility

32Cited by
15References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 1994
Grant dateJul 18, 1995
Priority date
Expiry dateApr 8, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

FET devices according to the invention are made by etching separation grooves and the via-holes from the front surface of the substrate. Thereafter, the thickness of the substrate is reduced from the rear surface to expose the plating in the via-holes and separation grooves. A rear surface electrode and a plated heat sink are sequentially deposited on the rear surface of the thinned substrate. The devices are divided from a wafer by etching and/or severing along the separation grooves and at opposed locations along the plated heat sink.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.