Electronic component testing oven
US5436569A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 1994 |
| Grant date | Jul 25, 1995 |
| Priority date | — |
| Expiry date | Sep 30, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2849
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention, in one embodiment, provides a testing apparatus for electronic components to monitor their behavior at elevated temperatures. The invention comprises a transport belt with at least one carrier attached to the transport belt, the carrier being capable of retaining an electronic component. The carriers are adapted to contact bus bars positioned adjacent the transport belt to electrically connect a component retained by the carrier to an electrical power supply. The apparatus includes means for ramping up the electrical power applied to the component from an initial low voltage to a second, testing voltage. The apparatus includes a housing defining an oven cavity through which the transport belt may pass and means providing for maintaining the ambient temperature within a portion of the cavity at an elevated temperature and other embodiment, the carrier of the present invention comprises a slot for releasably retaining an electronic component and a retaining bar movable between the first component retaining position and a second, component releasing position, the retaining bar being capable of preventing electronic components from falling out of the slots when t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.