Image processing system for inspection of overprinted matter
US5440650A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 22, 1994 |
| Grant date | Aug 8, 1995 |
| Priority date | — |
| Expiry date | Mar 22, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An image processing system for inspection of an over-printed matter having at least first and second layers different in lightness under appropriate illumination, wherein a digital image of the surface of the overprinted matter is formed, first and second reference images representing each normal image of the first and second layers are memorized, a first deviation between a first boundary of the first reference image to the second reference image and a portion of the digital image corresponding with the first boundary is measured, a second deviation between a second boundary of the second reference image to the first reference image and a portion of the digital image corresponding with the second boundary is measured, the first reference image is corrected to a first corrected reference image in such a manner as to eliminate the measured first deviation, the second reference image is corrected to a second corrected reference image in such a manner as to eliminate the measured second deviation, a finally corrected reference image is produced on a basis of logical sum of the first and second corrected reference images, and a matching process of the finally corrected reference image …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.