Combined expert system/neural networks method for process fault diagnosis
US5442555A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 1993 |
| Grant date | Aug 15, 1995 |
| Priority date | — |
| Expiry date | Oct 7, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S706/915
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
A two-level hierarchical approach for process fault diagnosis is an operating system employs a function-oriented approach at a first level and a component characteristic-oriented approach at a second level, where the decision-making procedure is structured in order of decreasing intelligence with increasing precision. At the first level, the diagnostic method is general and has knowledge of the overall process including a wide variety of plant transients and the functional behavior of the process components. An expert system classifies malfunctions by function to narrow the diagnostic focus to a particular set of possible faulty components that could be responsible for the detected functional misbehavior of the operating system. At the second level, the diagnostic method limits its scope to component malfunctions, using more detailed knowledge of component characteristics. Trained artificial neural networks are used to further narrow the diagnosis and to uniquely identify the faulty component by classifying the abnormal condition data as a failure of one of the hypothesized components through component characteristics. Once an anomaly is detected, the hierarchical structure is used…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.