Apparatus and method for recording over defects in storage media
US5442638A · kind A · utility
34Cited by
8References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 10, 1994 |
| Grant date | Aug 15, 1995 |
| Priority date | — |
| Expiry date | Jan 10, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Storage media defect areas that are too large to be managed by ECC processing alone and sufficiently small that read/write head clock synchronization can be maintained over the defect area, are managed by a fill pattern recording scheme in which an offset register indicates the beginning of a defect area and a fill pattern is recorded over the defect area while ECC processing is halted. Data recording is resumed after the defect area is passed. In this way, the number of times sector skipping must be used for a storage media is reduced, thereby making more efficient use of the storage media surface area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.