Integrated circuit chip with testing circuits and method of testing the same
US5442643A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 23, 1993 |
| Grant date | Aug 15, 1995 |
| Priority date | — |
| Expiry date | Mar 23, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit (IC) chip which can be tested even after being packaged on a circuit board together with other IC chips, and a method of testing such IC chips on the circuit board are provided. The IC chip has a main IC section to which a particular function is assigned, and a plurality of testing circuits capable of freely extracting output data of the main IC section on a common bus. An interface is also provided on the IC chip which receives signals for controlling the testing circuits from the outside. The testing circuits, therefore, can selectively hold data sent from the outside or data from the main IC section and then send the data out via input/output terminals thereof or the interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.