Patent · US Expired

Method and apparatus for adaptive learning type general purpose image measurement and recognition

US5442716A · kind A · utility

25Cited by
9References
4Claims
0Family size

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Key dates

Filing dateJun 24, 1993
Grant dateAug 15, 1995
Priority date
Expiry dateJun 24, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/70
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An adaptive learning type general purpose image measurement and recognition method includes the steps of extracting a large number of basic initial features having values which are invariant to parallel displacement of an object to be caught in an image frame and which have additivity with respect to the image frame, and performing statistical feature extraction having a learning function on the basis of a multivariate analysis method applied to the extracted initial features to thereby adaptively enable use for various types of measurement. Further, An adaptive learning type general purpose image measurement and recognition apparatus includes a pick-up device for picking up objects of measurement in two dimensions, an image cutting-out device for partially cutting out video signals of the picked-up images, a correlating device for computing Nth order autocorrelation of the cut-out data, a memory device for storing coefficients of the autocorrelation, and an arithmetic controlling device respetive devices and for carrying out multivariate analysis based on the computed values to thereby adaptively enable use for various types of measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.