Bar code scan stitching
US5444231A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 1995 |
| Grant date | Aug 22, 1995 |
| Priority date | — |
| Expiry date | Jan 18, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/1486
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Combining scan fragments of a bar code symbol. Each fragment is represented by a series of values, with each value representing the width of an element in the fragment. The alignment at which the fragments are combined is determined by shifting the alignment of the fragments over a range of positions, and determining for each position an index of the overall degree of similarity between the aligned values of the two fragments at that position. The fragments are combined at an alignment that produces a relatively larger index value (e.g., that maximizes the index). The index of overall similarity may be a correlation factor representing the degree of correlation, at each tested alignment, between the series of values representing each fragment. The index of overall similarity may alternately be the number of consecutive matching elements. At each position, the values in each series are compared and the number of consecutive values that match within a preselected tolerance is determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.