Interference device and method for observing phase informalities
US5446589A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Aug 10, 1993 |
| Grant date | Aug 29, 1995 |
| Priority date | — |
| Expiry date | Aug 10, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H5/00
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An interference device and method for observing phase information, using electron or other waves with the amplitude difficult to split by a half mirror. Using an interference device comprising in combination two scattering films A1 and A2 capable of scattering incident waves randomly, first lens systems B1 and B2 that are located between said two scattering films to form the image of one scattering film A1 on the other scattering film A2, a second lens system B3 for forming on an observation surface C the image of a specimen 2 located at a position where a component going straight through said one scattering film is converged in a spot form through said first lens system or a part thereof, and means for recording an interference pattern formed on the observation surface C, an interference pattern is detected while the specimen 2 is inserted in the arrangement, and an interference pattern is detected while the specimen 2 is removed from the arrangement, so that the difference between both the interference patterns, or the sum or product of them, can be found to observe the phase information of the specimen directly as interference fringes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.