Patent · US Expired

Method for forming an amorphous silicon programmable element

US5447880A · kind A · utility

14Cited by
9References
14Claims
0Family size

Assignees

Inventors

Key dates

Filing dateApr 5, 1994
Grant dateSep 5, 1995
Priority date
Expiry dateApr 5, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming an amorphous silicon programable element which requires less than about one square micron of area. The method includes the steps of forming a bottom conductor, depositing an interlayer dielectric above the bottom conductor, forming a via in the interlayer dielectric, depositing an anti-fuse layer above the bottom conductor within the via, and chemical vapor depositing a conductive plug above the anti-fuse layer and within the via. The method may additionally include the step of chemical vapor depositing a top conductor above the conductive plug.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.