Integrated bit error rate test function in analog channel unit of digital cellular network
US5448616A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 1993 |
| Grant date | Sep 5, 1995 |
| Priority date | — |
| Expiry date | Jul 30, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L7/046
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An internal bit error rate (BER) test capability is built into the analog channel unit of a digital cellular base station. This test capability is controlled by the mobile telephone switching office (MTSO) to automatically perform BER measurements. The analog channel unit with this integrated function performs random sequence generation, continuous frequency shift keying (FSK) modulation, FSK random sequence acquisition, FSK demodulation and bit error tallying. The BER test functions built into the analog channel unit allow the tests to be performed via remote control from an operations and maintenance center of the MTSO. Having the BER test functions built into the analog channel unit reduces the number of physical interfaces which the analog channel unit has to support.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.