Patent · US Expired

MOS-controlled power semiconductor component

US5449938A · kind A · utility

2Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 8, 1994
Grant dateSep 12, 1995
Priority date
Expiry dateFeb 8, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A power semiconductor component having integrated protection against electrostatic destruction is published. Such a semiconductor component (1) comprises a semiconductor substrate (10) having at least one MOS structure whose gate (7) is arranged insulated from the semiconductor substrate (10). Such structures are susceptible to destruction by a dielectric breakdown of the insulation layer, caused by electrostatic charging. According to the invention, this insulating layer between-the gate electrode (3) and the main electrode (2) is now replaced by a semi-insulating layer (9) so that a limited current flow becomes possible between the gate (7) and the main electrode (2) and it is no longer possible for any potential difference to build up.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.