Patent · US Expired

Semiconductor infrared image pickup device and method of fabricating the same

US5449944A · kind A · utility

7Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 1, 1994
Grant dateSep 12, 1995
Priority date
Expiry dateDec 1, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/1843

Abstract

A semiconductor image pickup device comprises a photo-sensing substrate and a signal processing substrate, wherein the photo-sensing substrate further comprises a plurality of detector elements, and the signal processing substrate comprises a plurality of input diodes, each detector element being operatively connected to the respective input diode. The detector elements are isolated and light shielded from each other and further from the signal processing substrate by a light shield layer, and each detector element has an input port for incident rays on an input side of the photo-sensing substrate and has a surface region on the opposite side for outputting a signal to the input diode. The light shield layer of the invention comprises an insulation multilayer and a metal layer laminated in this order from the input side of the incident rays. The embodiments utilize a silicon nitride layer and zinc sulphide layer as the insulation multilayer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.