Patent · US Expired

Monolithic integrated semiconductor device

US5449949A · kind A · utility

1Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 11, 1993
Grant dateSep 12, 1995
Priority date
Expiry dateJun 11, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/642

Abstract

A monolithic integrated semiconductor is proposed, in which on the main surface of a monolithically integrated n-p-n transistor or p-n-p transistor, a cover electrode (D1) is mounted for internal voltage limitation, covering only a single junction region between a highly doped zone (5) and the weakly doped substrate (1). An adjacent highly doped zone (4) is not covered by the cover electrode (D1). By connecting the metal cover electrode (D1) to the pickup (12) for a voltage divider (R1, R2), a breakdown voltage can be adjusted that is higher than the sum of the depletion breakdown voltage and the enhancement breakdown voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.