Apparatus and method for measuring and applying a convolution function to produce a standard Raman spectrum
US5455673A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 27, 1994 |
| Grant date | Oct 3, 1995 |
| Priority date | — |
| Expiry date | May 27, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Raman spectrometry apparatus that is capable of measuring and compensating for variabilities in the apparatus comprises a source of substantially monochromatic radiation, means for simultaneously interfacing the radiation with a sample and a reference material, means for simultaneously acquiring at more than one wavelength a convolved Raman spectrum of the sample and a convolved spectrum of the reference material, and means for determining the convolution function of the convolved spectra and applying the convolution function to adjust the convolved Raman spectrum of the sample to produce thereby the standard Raman spectrum of the sample. A method for obtaining the standard Raman spectrum of a sample comprises: (a) simultaneously irradiating the sample and a reference material with a substantially monochromatic radiation source; (b) simultaneously acquiring at more than one wavelength a convolved Raman spectrum of the sample and a convolved spectrum of the reference material; (c) choosing the standard spectrum of the reference material; (d) from the convolved Raman spectrum of the sample and the convolved spectrum of the reference material and the standard spectrum of the referen…
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