Patent · US Expired

Cutting apparatus for use in an automated analytical instrument

US5460778A · kind A · utility

24Cited by
11References
2Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 27, 1993
Grant dateOct 24, 1995
Priority date
Expiry dateDec 27, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/114165
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automated analytical instrument for conducting assays for components of interest in fluid samples. The instrument includes a rotably mounted supply unit or segment adapted to hold a plurality of foil-sealed magazines containing assay modules, a testing system for assaying a fluid sample for a component of interest using an assay module, an assay module transport assembly for transporting an assay module from a magazine in the supply unit to the testing system, and a microprocessor for controlling the operation of the automated analytical instrument. In one embodiment, the assay module transport assembly includes a cutter assembly for cutting away a layer of material such as a thin foil layer covering a desired assay module within the magazine, an assay module receiving platform disposed in front of the magazine, an assay module ejector mechanism for pushing an assay module from the magazine onto the assay module receiving platform, and an assay module transfer mechanism for moving the assay module from the assay module receiving platform to the testing system. The cutter assembly and the assay module receiving platform are movable vertically on a first elevator assembly, and the…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.