Device for testing for a high voltage on the chassis of a piece of electronic apparatus
US5461317A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 23, 1994 |
| Grant date | Oct 24, 1995 |
| Priority date | — |
| Expiry date | May 23, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/52
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for testing for leakage of electronic equipment has a female AC connector for receiving the male AC connector of the electronic equipment to be tested and a male AC connector for attaching the test device to a source of AC power. The device also includes an electrically conductive probe and a meter for detecting a voltage on a surface contacted by the probe. Within the device are first and second switches which connect the male AC connector and the female AC connector in four successive configurations for applying AC power to the connector of the piece of equipment to be tested. A sequencing circuit in the device operates the two switches to apply all four test configurations within an interval of 1.033 seconds. The probe and the meter for detecting a current in the probe is used to contact the conductive surfaces of the piece of equipment being tested to detect a voltage while the four tests are applied to the power connector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.