Examination apparatus for examining an object having a spheroidal reflective surface
US5463430A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 29, 1993 |
| Grant date | Oct 31, 1995 |
| Priority date | — |
| Expiry date | Jul 29, 2013 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/107
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An examination apparatus for examining an object having a spheroidal reflecting surface provides a first index projecting optical system for projecting a first measuring index onto the object to be examined at a designated angle, a second index projecting optical system for projecting a second measuring index having a different optical distance from the first index onto the object at the designated angle, so that each reflected images of the first and second measuring index have a designated image height relationship therebetween when the object is placed at a designated working distance, and respective image height of reflected images of the first and second measuring index are detected by a detecting optical system with a photoelectric conversion apparatus, whereby whether the working distance between the object and the apparatus is right or not is judged by processing a signal detected by the photoelectric conversion apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.