Electro-optical system for gauging surface profile deviations using infrared radiation
US5463464A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 1993 |
| Grant date | Oct 31, 1995 |
| Priority date | — |
| Expiry date | Oct 13, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for gauging the surface of a test object includes an image sensor, such as a camera, positioned to receive an image of the radiation naturally emitted from the test object through an attenuating medium. The intensity of such radiation varies across the image as a function of the deviation of the test object surface from a nominal surface profile. The sensor output is digitized to form a set of digital signals indicative of the intensity of radiation across the image, and the digitized signals are stored in digital electronic memory and/or displayed on a screen. Methods for correcting optically generated errors in the image are disclosed that, together with the gauging system, provide a quantitative measurement of the deviations in a test object surface profile from a preselected profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.